Analytical equipment for research of nanomaterials at the TU Freiberg

Transmission Electron Microscope

Allows to examine the structural quality of the layers and interfaces, their thickness, and parameters of nanoscale inclusions and individual nanoparticles.


X-ray Photoelectron Spectroscopy

A quantitative method for studying the elemental composition, empirical formula, chemical and electronic state of the atoms present in the material.


Scanning Electron Microscope combined with a Focused Ion Beam FEI Helios NanoLab 600

  • The electron beam is used to obtain images of the surface, modified by ion beam. For the formation of the ion beam source Ga is used.

  • There are four manipulator for measuring the electrical characteristics.

  • To clean the surface of the sample is used a plasma source.

  • Available a gas supply system for applying layers of platinum, carbon, or a dielectric with a high spatial resolution.


Wavelength Dispersive X-Ray Fluorescence spectrometer S8 Tiger, Bruker

Method for rapid analysis with high precision all the elements from U to B in a wide spectrum of samples of solids, powders, liquids and so on. The limits of sensitivity in the range of 0.1 to 10 ppm.

Measurement accuracy - less than ± 0.1%


Scanning probe microscopes Dimension 3000 DI  и Multimode Veeco

Obtaining images of the surface topography with high vertical and lateral resolutions.


Equipment for X-Ray Diffraction

Bruker D8 Advance, Thin film diffraction

Bruker D8 Advance, Powder diffraction

Bruker D8 Discover

Bruker D8 Quest, Single crystal diffraction

For studies of crystal structure of materials.